Energy dissipation in multifrequency atomic force microscopy
نویسندگان
چکیده
منابع مشابه
Energy dissipation in multifrequency atomic force microscopy
The instantaneous displacement, velocity and acceleration of a cantilever tip impacting onto a graphite surface are reconstructed. The total dissipated energy and the dissipated energy per cycle of each excited flexural mode during the tip interaction is retrieved. The tip dynamics evolution is studied by wavelet analysis techniques that have general relevance for multi-mode atomic force micros...
متن کاملCorrection to "Energy dissipation in multifrequency atomic force microscopy"
In the section "Energy dissipation" of the above manuscript, there is a typesetting error in the mathematical expressions after Equation 5. The correct form must be: The energy balance of each decaying mode obtained from Equation 4 in the time window 0 < t < τ = 200 μs (see Figure 1) can be written as where i is the index of the mode, ΔK i = 1/2 m eq (v i (0) 2 − v i (τ) 2) is the variation of ...
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Atomic scale dissipation is of great interest in nanomechanics and atomic manipulation. We present dissipation measurements with a linearized, ultra-small amplitude atomic force microscope which is capable of measuring dissipation at chosen, fixed separations. We show that the dynamic dissipation in the noncontact regime is of the order of a few 10-100 meV per cycle. This dissipation is likely ...
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In multifrequency atomic force microscopy higher eigenmodes are externally excited to enhance resolution and contrast while simultaneously increasing the number of experimental observables with the use of gentle forces. Here, the implications of externally exciting multiple frequencies are discussed in terms of cantilever anharmonicity, fundamental period and the onset of subharmonic and superh...
متن کاملUbiquitous mechanisms of energy dissipation in noncontact atomic force microscopy.
Atomistic simulations considering larger tip structures than hitherto assumed reveal novel dissipation mechanisms in noncontact atomic force microscopy. The potential energy surfaces of realistic silicon tips exhibit many energetically close local minima that correspond to different structures. Most of them easily deform, thus causing dissipation arising from hysteresis in force versus distance...
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ژورنال
عنوان ژورنال: Beilstein Journal of Nanotechnology
سال: 2014
ISSN: 2190-4286
DOI: 10.3762/bjnano.5.57